Finite-dimensional model for defect-trapped light in planar periodic nonlinear structures

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Updated: Jul 19, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Alejandro B Aceves1, Tomás Dohnal

  • 1Department of Mathematics and Statistics, University of New Mexico, Albuquerque, New Mexico 87131, USA.

Optics Letters
|September 27, 2006
PubMed

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