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Updated: Jul 19, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Effect of strain on the carrier mobility in heavily doped p-type Si

Lucia Romano1, Alberto Maria Piro, Maria Grazia Grimaldi

  • 1CNR-MATIS and Dipartimento di Fisica e Astronomia, Università di Catania, Via S. Sofia 64, I-95123 Catania, Italy. lucia.romano@ct.infn.it

Physical Review Letters
|October 10, 2006
PubMed

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