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Updated: Jul 19, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

X-ray microprobe of orbital alignment in strong-field ionized atoms

L Young1, D A Arms, E M Dufresne

  • 1Argonne National Laboratory, Argonne, Illinois 60439, USA. young@anl.gov

Physical Review Letters
|October 10, 2006
PubMed

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