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Extended bidirectional reflectance distribution function for polarized light scattering from subsurface defects under

Jian Shen1, Degang Deng, Weijin Kong

  • 1Shangai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China. shj@siom.ac.cn

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|October 19, 2006
PubMed
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This study introduces an extended bidirectional reflectance distribution function (BRDF) to model polarized light scattering from subsurface defects (SSDs). The derived BRDF accurately predicts scattering behavior based on defect properties and incidence angles.

Area of Science:

  • Optics
  • Materials Science
  • Surface Science

Background:

  • Subsurface defects (SSDs) significantly influence material optical properties.
  • Accurate modeling of polarized light scattering from SSDs is crucial for material characterization and quality control.
  • Existing models often lack the detail to capture complex scattering phenomena from statistically distributed defects.

Purpose of the Study:

  • To derive an extended bidirectional reflectance distribution function (BRDF) incorporating scattering probability and statistical distributions of subsurface defects (SSDs).
  • To enable accurate calculation and comparison with measurements of polarized light scattering from SSDs.
  • To investigate the influence of various SSD and substrate parameters on the extended BRDF.

Main Methods:

Related Experiment Videos

  • Derivation of an extended BRDF from the Jones scattering matrix.
  • Introduction of scattering probability and statistical distribution functions for SSD radius, refractive index, and position.
  • Numerical calculation using the Monte Carlo method for p-polarized incident light.
  • Investigation of parameter influences on the extended BRDF.

    • Main Results:

    • The extended BRDF strongly depends on light incidence angle, scattering angle, and out-of-plane azimuth angle.
    • A 180-degree symmetry was observed with respect to the azimuth angle.
    • The influence of SSD density, substrate refractive index, SSD radius, and refractive index distributions were quantified.
    • For transparent substrates, the dependence of the extended BRDF on SSD positions was determined.

    Conclusions:

    • The developed extended BRDF provides a robust framework for analyzing polarized light scattering from SSDs.
    • The study highlights the critical impact of defect statistical properties and optical parameters on scattering patterns.
    • This model facilitates improved non-destructive evaluation and characterization of materials with subsurface imperfections.