Quantitative high resolution transmission electron microscopy of nanostructured semiconductors

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Updated: Jul 19, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

W Neumann1, H Kirmse, I Häusler

  • 1Institute of Physics, Humboldt University of Berlin, Berlin, Germany. wolfgang.neumann@physik.hu-berlin.de

Journal of Microscopy
|October 25, 2006
PubMed

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