Piezoelectric field around threading dislocation in GaN determined on the basis of high-resolution transmission

G Maciejewski1, S Kret, P Ruterana

  • 1Institute of Fundamental Technological Research PAS, 00-049 Warsaw, ul. Swietokryska 21, Poland. gmaciej@ippt.gov.pl

Journal of Microscopy
|October 25, 2006
PubMed

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