CBED and LACBED characterization of crystal defects

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Updated: Jul 19, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

J P Morniroli1

  • 1Laboratoire de Métallurgie Physique et Génie des Matériaux, UMR CNRS 8517, USTL & ENSCL, Cité Scientifique, 59500 Villeneuve d'Ascq, France. Jean-Paul.Morniroli@univ-lille1.fr

Journal of Microscopy
|October 25, 2006
PubMed

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