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Updated: Jul 19, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Shear banding in twinned structure of copper deformed at 77 K
H A Paul1, A Morawiec, E Bouzy
1Institute of Metallurgy and Materials Science, PAS, 25 Reymonta St., 30-059 Kraków, Poland. nmpaul@imim-pan.krakow.pl
Abstract:
The local crystallography and microstructure within shear bands has been examined in single crystals of {112}<111> orientation of pure copper deformed at 77 K by channel-die compression to true strains of about 1. Setting up a system for making high-resolution orientation maps using transmission electron microscopy has provided advantageous circumstances for the analysis of orientation changes within shear bands. The present work shows that, despite the plane strain deformation mode, the mechanism of lattice rotation within emerging shear bands may lead to Goss {110}< 001> and Brass{110}<112> texture components.
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