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Updated: Jul 19, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in
H Paul1, J H Driver, J Morgiel
1Institute of Metallurgy and Materials Science, PAS, 25 Reymonta St., 30-059 Krakow, Poland. nmpaul@imim-pan.krakow.pl
Abstract:
The crystallography of recrystallization has been investigated in channel-die deformed pure aluminium bicrystals with {100}<011>/{110}<001> orientations. The microstructural and microtextural changes during the early stages of recrystallization were followed by systematic local orientation measurements using scanning and transmission electron microscopes. In particular, orientation mapping combined with in situ sample heating was used to investigate the formation and growth of new grains at very early stages of recrystallization. Grain boundary migration and 'consumption' of the as-deformed areas was always favoured along directions parallel to the traces of the {111} slip planes that had been most active during deformation.
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