Circumferential and longitudinal defect detection using T(0,1) mode excited by thickness shear mode piezoelectric

Zenghua Liu1, Cunfu He, Bin Wu

  • 1Modern Measurement and Control Technique Lab, College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Ping Le Yuan 100, Chaoyang District, Beijing 100022, China. LZHBULL@emails.bjut.edu.cn

Ultrasonics
|October 27, 2006
PubMed

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