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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Patterning of cantilevers with inverted dip-pen nanolithography: efforts toward combinatorial AFM

Shiau-Yin Wu1, Richard Berkenbosch, Andrea Lui

  • 1Department of Chemistry, University of Alberta, Edmonton, Alberta CanadaT6G-2G2.

The Analyst
|October 27, 2006
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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...