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Generalized Yamaguchi correlation factor for coherent quadratic phase speckle metrology systems with an aperture
Damien P Kelly1, Jennifer E Ward, Unnikrishnan Gopinathan
1School of Electrical, Electronic and Mechanical Engineering, University College Dublin, Dublin, Ireland.
Abstract:
In speckle-based metrology systems, a finite range of possible motion or deformation can be measured. When coherent imaging systems with a single limiting aperture are used in speckle metrology, the observed decorrelation effects that ultimately define this range are described by the well-known Yamaguchi correlation factor. We extend this result to all coherent quadratic phase paraxial optical systems with a single aperture and provide experimental results to support our theoretical conclusions.
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