Wavelength- and energy-dispersive Electron Probe Microanalysis (EPMA) measurements with non-perpendicular incidence

G F Bastin1, P J T L Oberndorff, H J M Heijligers

  • 1Laboratory of Solid State and Materials Chemistry, University of Technology, PO Box 513, NL-5600 MB Eindhoven, the Netherlands. G.F.Bastin@tue.nl

Journal of Microscopy
|November 15, 2006
PubMed

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