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Scanning electron microscopy and transmission electron microscopy microstructural investigation of high-speed tool

S Kac1, J Kusinski, A Zielinskalipiec

  • 1Faculty of Metallurgy and Materials Science, University of Mining and Metallurgy, 30 Mickiewicza Ave., 30-059 Krakow, Poland. skac@tempus.metal.agh.edu.pl

Journal of Microscopy
|November 15, 2006
PubMed

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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