Resolving radial composition gradients in polarized confocal raman spectra of individual 3C-SiC nanowires

Silicon carbide nanowires are being actively pursued as components for nanoelectromechanical sensors, nanocatalytic elements, and nano-optical circuits able to operate in harsh environment, high temperature, and high power applications. The effect of geometric confinement and polarization anisotropy in confocal Raman spectroscopy has been employed to detect axial and radial composition information in individual nanowires. Polarization anisotropy causes a significant increase in signal from the surface layer (relative to bulk), and combined with the increased surface-to-volume ratio at the nanoscale, it allows for the direct characterization of bulk and surface defects.