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A statistics-based approach to binary image registration with uncertainty analysis.
Katherine M Simonson1, Steven M Drescher, Franklin R Tanner
1Sandia National Laboratories, PO Box 5800, Mail Stop 1208, Albuquerque, NM 87185-1208, USA. kmsimon@sandia.gov
IEEE Transactions on Pattern Analysis and Machine Intelligence
|November 17, 2006
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