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Updated: Jul 18, 2026
On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
Published on: March 11, 2022
Crystallization and preliminary X-ray crystallographic studies of the oxidative-stress sensor SoxR and its complex
Satoshi Watanabe1, Akiko Kita, Kazuo Kobayashi
1Department of Chemistry, Graduate School of Science, Kyoto University, Sakyo-ku, Kyoto 606-8502, Japan.
Abstract:
SoxR, a member of the MerR family of transcriptional activators, functions as a sensor of oxidative stress. The redox states of the 2Fe-2S cluster of SoxR regulate the activity of SoxR. Here, the crystallization and preliminary crystallographic analysis of SoxR and its complex with DNA are reported. Crystals of SoxR were obtained using PEG 10,000 and glycerol as precipitants. The crystals of SoxR belong to space group P6(2) or P6(4), with unit-cell parameters a = b = 80.0, c = 88.1 A. Crystals of the SoxR-DNA complex were obtained using a 20 bp DNA fragment from a condition containing PEG 10,000 and sodium/potassium tartrate. The crystals of the SoxR-DNA complex belong to space group P6(1)22 or P6(5)22, with unit-cell parameters a = b = 53.5, c = 355.6 A. Diffraction data were collected to a maximum resolution of 3.2 and 2.7 A for SoxR and the SoxR-DNA complex, respectively.
