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Updated: Jul 18, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Stark tuning of donor electron spins in silicon

F R Bradbury1, A M Tyryshkin, Guillaume Sabouret

  • 1Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA. bradbury@princeton.edu

Physical Review Letters
|December 13, 2006
PubMed

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