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Mechanical properties of nanoparticle chain aggregates by combined AFM and SEM: isolated aggregates and networks

Weizhi Rong1, Weiqiang Ding, Lutz Mädler

  • 1Chemical and Biomolecular Engineering Department, University of California at Los Angeles, Los Angeles, California 90095, USA.

Nano Letters
|December 14, 2006
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...