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Laser microprobe with fourier transform ion cyclotron resonance mass spectrometer for surface analysis
Harri Moisio1, Luc Van Vaeck, Frank Vangaever
1MiTAC, Department of Chemistry, University of Antwerp (CDE), Universiteitsplein 1, B-2610 Wilrijk, Belgium. harri.moisio@ua.ac.be
Analytical Chemistry
|December 30, 2006
Summary
Fourier transform ion cyclotron resonance laser microprobe mass spectrometry (FTICR LMMS) offers high-resolution local analysis of solids. A new ion source design enhances ion transfer, enabling sensitive detection of surface contaminants and embedded materials.
Area of Science:
- Analytical Chemistry
- Materials Science
- Spectroscopy
Background:
- Fourier transform ion cyclotron resonance laser microprobe mass spectrometry (FTICR LMMS) is a powerful technique for localized solid analysis.
- Existing ion sources can limit the efficiency of ion extraction and transfer, impacting analytical sensitivity.
- High mass resolution is crucial for distinguishing complex molecular species in various matrices.
Purpose of the Study:
- To develop and validate a novel ion source design for FTICR LMMS.
- To improve the efficiency of ion extraction and transfer from an external laser microprobe source.
- To demonstrate the enhanced analytical performance of the modified FTICR LMMS system.
Main Methods:
- Implementation of a new ion source design for FTICR LMMS.
- Ion trajectory calculations to predict ion trapping efficiency.
- Analytical verification using chemisorbed monolayers on copper and dyes in a polymer matrix.
Main Results:
- The new ion source design demonstrated improved ion trapping capabilities for ions emitted at various angles.
- Successful detection of chemisorbed benzotriazole on copper with reduced sample consumption compared to static secondary ion mass spectrometry.
- Feasibility of analysis and quantification of dyes within a polymer matrix was confirmed.
Conclusions:
- The enhanced ion source significantly improves the performance of FTICR LMMS.
- The technique is suitable for sensitive surface analysis and quantification of embedded materials.
- FTICR LMMS with the new ion source offers a valuable tool for materials characterization.
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