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Updated: Jul 17, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Verifying DiffEXAFS measurements with differential X-ray diffraction
M P Ruffoni1, R F Pettifer, S Pascarelli
1Department of Physics, University of Warwick, Coventry CV4 7AL, UK. m.p.ruffoni@warwick.ac.uk
Abstract:
Differential EXAFS (DiffEXAFS) is a novel technique for measuring atomic perturbations on a local scale. Here a complementary technique for such studies is presented: differential X-ray diffraction (DiffXRD), which may be used to independently verify DiffEXAFS results whilst using exactly the same experimental apparatus and measurement technique. A test experiment has been conducted to show that DiffXRD can be used to successfully determine the thermal expansion coefficient of SrF(2).
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