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Related Experiment Videos

Verifying DiffEXAFS measurements with differential X-ray diffraction.

M P Ruffoni1, R F Pettifer, S Pascarelli

  • 1Department of Physics, University of Warwick, Coventry CV4 7AL, UK. m.p.ruffoni@warwick.ac.uk

Journal of Synchrotron Radiation
|January 11, 2007
PubMed
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Differential X-ray diffraction (DiffXRD) is a new method to study atomic changes, complementing Differential EXAFS. This technique was successfully used to measure the thermal expansion of SrF(2).

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Crystallography

Background:

  • Local atomic perturbations are crucial for understanding material properties.
  • Differential EXAFS (DiffEXAFS) is a technique for probing these perturbations.
  • Independent verification of DiffEXAFS results is needed.

Purpose of the Study:

  • Introduce differential X-ray diffraction (DiffXRD) as a complementary technique to DiffEXAFS.
  • Demonstrate the utility of DiffXRD for studying atomic perturbations.
  • Validate DiffXRD by measuring the thermal expansion coefficient of SrF(2).

Main Methods:

  • Utilized the same experimental apparatus and measurement technique as DiffEXAFS.
  • Employed differential X-ray diffraction (DiffXRD) for analysis.

Related Experiment Videos

  • Performed a test experiment on Strontium Fluoride (SrF(2)).

    • Main Results:

    • Successfully implemented DiffXRD as a complementary technique.
    • Demonstrated the capability of DiffXRD to independently verify DiffEXAFS results.
    • Accurately determined the thermal expansion coefficient of SrF(2) using DiffXRD.

    Conclusions:

    • DiffXRD is a viable and complementary technique for studying local atomic perturbations.
    • DiffXRD can be used to independently validate DiffEXAFS findings.
    • The thermal expansion coefficient of SrF(2) can be reliably measured with DiffXRD.