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Parasitic diffuse reflection in a Fourier transform spectrometer yielding subharmonic ghosts and line-shape
Geneviève Taurand1, Jérôme Genest, Maxime Cadotte
1Centre d'Optique, Photonique et Laser, Département de Génie Electrique et de Génie Informatique, Université Laval, Québec, Canada. genevieve.taurand.1@ulaval.ca
Subharmonic ghosts in Fourier transform spectrometers (FTS) arise from parasitic reflections. These spectral artifacts impact radiometric accuracy and instrument line shape, affecting measurement reliability.
Area of Science:
- Spectroscopy
- Optical Engineering
Background:
- High-resolution Fourier transform spectrometers (FTS) are susceptible to spectral artifacts.
- Parasitic diffuse reflections within the FTS optical path can lead to ghost signals.
Purpose of the Study:
- To investigate the origin and characteristics of subharmonic ghosts in cube-corner FTS.
- To understand the impact of diffuse reflections on spectral measurements.
Main Methods:
- Utilized a high-resolution Fourier transform spectrometer in a cube-corner configuration.
- Analyzed spectral data to identify and characterize subharmonic ghost signals.
- Investigated the role of parasitic diffuse reflections on interferometer mirrors.
Main Results:
- Observed subharmonic ghosts in the FTS spectra, attributed to diffuse reflections.
- Identified that these reflections cause beams to travel different optical paths, altering optomechanical gain.
- Demonstrated that both reference laser and measurement channels are affected, leading to sampling jitter and additive subharmonics.
Conclusions:
- Diffuse reflections are a primary source of subharmonic ghosts in cube-corner FTS.
- These ghosts compromise spectral accuracy, affecting instrument line shape and radiometric calibration.
- Mitigation strategies for diffuse reflections are crucial for reliable FTS operation.
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