Parasitic diffuse reflection in a Fourier transform spectrometer yielding subharmonic ghosts and line-shape

Geneviève Taurand1, Jérôme Genest, Maxime Cadotte

  • 1Centre d'Optique, Photonique et Laser, Département de Génie Electrique et de Génie Informatique, Université Laval, Québec, Canada. genevieve.taurand.1@ulaval.ca

Applied Optics
|January 19, 2007
PubMed
Summary

Subharmonic ghosts in Fourier transform spectrometers (FTS) arise from parasitic reflections. These spectral artifacts impact radiometric accuracy and instrument line shape, affecting measurement reliability.

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