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Photochemical Oxidative Growth of Iridium Oxide Nanoparticles on CdSe@CdS Nanorods
Published on: February 11, 2016
Measurements of the hard-x-ray reflectivity of iridium
S Romaine1, R Bruni, P Gorenstein
1Harvard-Smithsonian Center for Astrophysics, Cambridge, Massachusetts 02138, USA. sromaine@cfa.harvard.edu
Abstract:
In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.
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