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Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals

Clive A Prestidge1, Timothy J Barnes, William Skinner

  • 1Ian Wark Research Institute, The Australian Research Council Special Research Centre for Particle and Material Interfaces, University of South Australia, Mawson Lakes, SA 5095, Australia. clive.prestidge@unisa.edu.au

The Journal of Pharmacy and Pharmacology
|February 3, 2007
PubMed

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