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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...

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Related Experiment Video

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Measurement of Total Calcium in Neurons by Electron Probe X-ray Microanalysis
11:42

Measurement of Total Calcium in Neurons by Electron Probe X-ray Microanalysis

Published on: November 20, 2013

New developments in electron energy loss spectroscopy.

V J Keast1, M Bosman

  • 1School of Mathematical and Physical Science, The University of Newcastle, Callaghan, New South Wales, Australia. vicki.keast@newcastle.edu.au

Microscopy Research and Technique
|February 7, 2007
PubMed
Summary

Advanced electron microscopy techniques, like spectrum imaging (SI), offer detailed elemental and electronic structure analysis. This paper explores methods for processing large SI datasets, crucial for mapping complex bonding information.

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Last Updated: Jul 17, 2026

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Published on: November 20, 2013

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Electron microscopy utilizes spectroscopic signals (X-rays, energy loss) for local composition and electronic structure analysis.
  • Enhanced electron spectrometer resolution and sensitivity improve spectral quality.
  • Advances in spectral simulation and interpretation calculations support data analysis.

Purpose of the Study:

  • To review recent developments in electron spectroscopy and spectral simulation.
  • To focus on the shift towards mapping and imaging in analytical electron microscopy, particularly spectrum imaging (SI).
  • To explore approaches for processing large SI datasets for elemental, bonding, and electronic structure mapping.

Main Methods:

  • Review of advancements in electron spectroscopy and spectral simulation techniques.
  • Focus on spectrum imaging (SI) methodology for acquiring spatially resolved spectral data.
  • Exploration of data processing strategies for large-scale SI datasets.

Main Results:

  • Spectrum imaging (SI) is becoming widespread for elemental and electronic structure mapping in electron microscopy.
  • Processing large SI datasets presents a significant challenge, especially for mapping bonding and electronic structure.
  • The paper will discuss specific approaches for analyzing EELS-based SI data.

Conclusions:

  • Significant progress in electron spectroscopy and computational methods enhances analytical capabilities.
  • Spectrum imaging (SI) is a powerful tool for advanced materials characterization.
  • Effective data processing is essential for unlocking the full potential of SI for complex structural and electronic analyses.