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Evanescent fields - direct measurement, modeling, and application.

S T Huntington1, F Ladouceur

  • 1NANO-MNRF, School of Physics, University of Melbourne, Parkville, Australia. shaneth@unimelb.edu.au

Microscopy Research and Technique
|February 7, 2007
PubMed
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Scanning near field optical microscopy (SNOM) accurately measured silica waveguide evanescent fields. The study revealed tip oscillation amplitude strongly correlates with detection efficiency in different SNOM modes.

Area of Science:

  • Optics and Photonics
  • Materials Science

Background:

  • Evanescent fields surrounding optical waveguides are crucial for near-field optical microscopy.
  • Understanding field distribution and distortions is essential for accurate measurements.

Purpose of the Study:

  • To accurately measure the evanescent field of a planar silica waveguide using SNOM.
  • To investigate field distortions caused by edge effects and surface proximity.
  • To quantitatively compare collection efficiency between contact and intermittent contact SNOM modes.

Main Methods:

  • Utilized scanning near field optical microscopy (SNOM) for evanescent field measurement.
  • Compared experimental field data with theoretical models.
  • Analyzed the impact of tip oscillation amplitude on detection efficiency.

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Main Results:

  • Accurate measurement of the evanescent field surrounding a planar silica waveguide.
  • Detection of field distortions attributed to edge effects and proximity to the waveguide surface.
  • Quantified differences in collection efficiency between contact and intermittent contact SNOM.
  • Established a strong correlation between tip oscillation amplitude and detection efficiency.

Conclusions:

  • SNOM is effective for characterizing waveguide evanescent fields and their distortions.
  • Tip oscillation amplitude is a critical parameter influencing SNOM collection efficiency.
  • The findings provide insights for optimizing SNOM techniques for waveguide analysis.