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Updated: Jul 17, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Near-field characterization of effective optical interfaces
A Apostol1, D Haefner, A Dogariu
1CREOL, College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816-2700, USA.
Abstract:
The properties of many heterogeneous media depend on both the surface roughness and the local variations of the optical properties. An effective optical interface is usually invoked to describe the characteristics of such media. Using approaches specific to near-field optics, the two influences can be decoupled and a quantitative assessment of their contributions can be performed. It is also shown that a discrete random-walk model can be used to determine the magnitude of the dielectric constant fluctuations at subwavelength scales which, in turn, describe the morphology of optically inhomogeneous media.

