Near-field characterization of effective optical interfaces

A Apostol1, D Haefner, A Dogariu

  • 1CREOL, College of Optics and Photonics, University of Central Florida, Orlando, Florida 32816-2700, USA.

Summary

Researchers can now separate surface roughness from optical property variations in heterogeneous media. A random-walk model quantifies dielectric fluctuations, revealing subwavelength morphology for better optical characterization.

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