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X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jul 17, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Beyond the Rayleigh criterion: grating assisted far-field optical diffraction tomography.

Anne Sentenac1, Patrick C Chaumet, Kamal Belkebir

  • 1Institut Fresnel (UMR 6133), Université Paul Cézanne and Université de Provence, F-13397 Marseille Cedex 20, France.

Physical Review Letters
|February 7, 2007
PubMed
Summary

We developed a novel optical imaging system achieving superresolution below one-tenth of the wavelength. This breakthrough enables high-resolution imaging without near-field scanning, advancing optical microscopy techniques.

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Last Updated: Jul 17, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

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Computed Tomography-guided Time-domain Diffuse Fluorescence Tomography in Small Animals for Localization of Cancer Biomarkers
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Computed Tomography-guided Time-domain Diffuse Fluorescence Tomography in Small Animals for Localization of Cancer Biomarkers

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Area of Science:

  • Optics and Photonics
  • Nanotechnology
  • Materials Science

Background:

  • Traditional optical imaging is limited by the diffraction limit.
  • Achieving sub-wavelength resolution typically requires near-field techniques involving scanning probes.
  • Developing far-field methods for superresolution remains a significant challenge.

Purpose of the Study:

  • To propose and demonstrate an optical imaging system with resolution better than one-tenth of the wavelength.
  • To achieve wide-field superresolution imaging without near-field scanning.
  • To reconstruct sample properties from far-field diffracted light.

Main Methods:

  • Utilizing a periodically nanostructured substrate for sample deposition.
  • Illuminating the sample under various angles of incidence.
  • Employing an inversion algorithm to reconstruct relative permittivity maps from far-field data.

Main Results:

  • Demonstrated an optical imaging system with resolution surpassing the diffraction limit.
  • Achieved superresolution by leveraging high spatial frequencies from the nanostructured substrate.
  • Obtained wide-field images with near-field resolution capabilities.

Conclusions:

  • The proposed far-field optical imaging system overcomes the diffraction limit.
  • Nanostructured substrates and angle-resolved illumination are key to achieving superresolution.
  • This method offers a non-contact, wide-field approach for high-resolution imaging.