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Updated: Jul 17, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Bistability-mediated carrier recombination at light-induced boron-oxygen complexes in silicon

Mao-Hua Du1, Howard M Branz, Richard S Crandall

  • 1National Renewable Energy Laboratory, Golden, Colorado 80401, USA.

Physical Review Letters
|February 7, 2007
PubMed

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