Peimin Yan1, Shuozhong Wang, Luming Shi
1School of Communication and Information Engineering, Shanghai University, Shanghai 200072, P.R.China. Phone: 8621-56333213; Fax: 8621-56336908; e-mail: P.M. Yan: yanpeimin@126.com.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
This study enhances electrical impedance tomography (EIT) image resolution by modifying singular value decomposition with a threshold. The improved method offers better EIT image reconstruction than previous techniques.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: