Sensitivity of surface roughness parameters to changes in the density of scanning points in multi-scale AFM studies.

A Méndez-Vilas1, J M Bruque, M L González-Martín

  • 1Departamento de Física, Universidad de Extremadura, Avda. de Elvas s/n, 06071 Badajoz, Spain. amvilas@formatex.org

Ultramicroscopy
|February 13, 2007
PubMed