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Updated: Jul 17, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Response analysis for identifying the origin of photo-modulated current contrasts in scanning tunneling microscopic

Nobuyasu Naruse1, Yutaka Mera, Yukinobu Hayashida

  • 1Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan. naruse@exp.t.u-tokyo.ac.jp

Ultramicroscopy
|February 13, 2007
PubMed

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