A bayesian approach to deformed pattern matching of iris images

Jason Thornton1, Marios Savvides, B V K Vijaya Kumar

  • 1Department of Electronic and Electrical Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA. jthornto@andrew.cmu.edu

Summary

This article presents a new statistical method for comparing images that are stretched or warped, such as iris scans. By using a mathematical framework that accounts for these distortions, the system can more accurately identify matching patterns. This technique improves recognition accuracy while remaining fast enough for practical, real-time use in security systems.

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