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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jul 16, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

High-pressure scanning tunneling microscopy: tip reactions.

Brandon L Weeks1, Gengxin Zhang

  • 1Texas Tech University, Department of Chemical Engineering, Lubbock, Texas 79409, USA. Brandon.weeks@ttu.edu

Scanning
|March 3, 2007
PubMed
Summary

Scanning tunneling microscopy (STM) allows atomic-level surface imaging. However, in situ catalytic imaging can produce artifacts due to tip reactions, requiring careful data analysis.

Area of Science:

  • Surface science
  • Materials science
  • Nanotechnology

Background:

  • Scanning tunneling microscopy (STM) offers atomic resolution for imaging conductive surfaces.
  • The technique is versatile, operating in vacuum, high-pressure, and elevated temperature environments.
  • In situ imaging under catalytic conditions is possible, providing insights into surface reactions.

Purpose of the Study:

  • To investigate potential artifacts during in situ Scanning tunneling microscopy (STM) imaging under catalytic conditions.
  • To highlight the importance of careful data interpretation when using STM for in situ surface analysis.

Main Methods:

  • In situ Scanning tunneling microscopy (STM) was employed to image surfaces under reaction conditions.
  • Analysis focused on identifying and characterizing image artifacts potentially arising from tip-surface interactions.

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Last Updated: Jul 16, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

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Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
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Main Results:

  • Artifacts were observed during in situ STM imaging.
  • These artifacts are attributed to chemical reactions occurring on the microscope tip.
  • The presence of tip-based reactions can alter the perceived surface structure.

Conclusions:

  • In situ STM imaging, while powerful, can be susceptible to artifacts.
  • Reactions on the STM tip can lead to misinterpretation of surface structures.
  • Researchers must exercise caution and employ rigorous analysis when interpreting in situ STM data from reactive environments.