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Updated: Jul 16, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
Single-scan extraction of two-dimensional parameters of infrared focal plane arrays utilizing a Fourier-transform
S Rommeluère1, R Haïdar, N Guérineau
1Office National d'Etudes et de Recherches Aérospatiales, Chemin de la Huniere, Palaiseau, F-91761, France.
Abstract:
We present what is believed to be a novel experimental method to measure the technological parameters (spectral response and quantum yield) of an infrared focal plane array. This method makes original use of a Fourier transform spectrometer, which allows us to simultaneously extract the spectral performances of all pixels from one single set of measurements. The methodology used and the principle of the experimental setup are detailed. A Fourier analysis is shown to provide various optogeometrical information on the detector microstructure. A demonstrator based on the HgCdTe technology was designed, and satisfactory experimental results were obtained.
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