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Updated: Jul 16, 2026

Method and Instrumented Fixture for Femoral Fracture Testing in a Sideways Fall-on-the-Hip Position

Method and Instrumented Fixture for Femoral Fracture Testing in a Sideways Fall-on-the-Hip Position

Published on: August 17, 2017

Site-specific fracture plane determination using the FIB/TEM.

Robert E Hackenberg¹, Robert D Field, Pallas A Papin

¹Materials Science and Technology Division, Los Alamos National Laboratory, Mail Stop G770, Los Alamos, NM 87545, USA. roberth@lanl.gov

Ultramicroscopy

|March 14, 2007

Summary

A new method uses focused ion beam and transmission electron microscopy to determine crystallographic indices of fracture surfaces. This technique enables precise analysis of small facets on polycrystalline materials.

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Area of Science:

Materials Science
Crystallography
Surface Analysis

Background:

Determining crystallographic indices of fracture surfaces is crucial for understanding material failure mechanisms.
Existing methods can be limited in applicability to small surface areas or complex microstructures.

Purpose of the Study:

To introduce a novel method for determining the crystallographic indices of planar fracture surfaces.
To enable precise fracture plane analysis on small surface areas and polycrystalline samples.

Main Methods:

Utilizing a focused ion beam (FIB) instrument to extract transmission electron microscopy (TEM) foils from fracture surfaces.
Employing selected area diffraction (SAD) in TEM to identify crystallographic line directions within the extracted foils.
Calculating the fracture plane indices using the cross product of two determined crystallographic line directions.

Main Results:

The described method successfully determines crystallographic indices from small fracture surface areas.
The technique is capable of analyzing fracture planes on facets of polycrystalline materials.
Validation using cleavage fracture in pure zinc demonstrates the method's efficacy.

Conclusions:

This FIB-TEM-SAD approach offers a powerful tool for characterizing fracture planes with high precision.
The method advances the understanding of fracture mechanisms in various materials.
It provides a reliable means for crystallographic analysis of fracture surfaces, particularly in challenging polycrystalline samples.