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Updated: Jul 16, 2026

Quantitative Hardness Measurement by Instrumented AFM-indentation
Published on: November 22, 2016
Nondislocation origin of GaAs nanoindentation pop-in event
D Chrobak1, K Nordlund, R Nowak
1Nordic Hysitron Laboratory, Helsinki University of Technology, 02015 HUT, Finland.
Abstract:
The present Letter demonstrates a pop-in event that is caused by a nanoindentation-induced phase transformation in GaAs, and not accompanied by any dislocation nucleation. Our computer simulations reveal the appearance of the new phase, documented by the structural correlation functions and visualization of the atomic positions. This challenges the orthodox view that the initial pop-in event reflects nucleation of dislocations or their movement, and has a bearing on materials where dislocation activity is not present.

