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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Exchange bias dependence on interface spin alignment in a Ni80Fe20/(Ni,Fe)O thin film

H Ouyang1, K-W Lin, C-C Liu

  • 1Department of Materials Engineering, National Chung Hsing University, Taichung 402, Taiwan, Republic of China.

Physical Review Letters
|March 16, 2007
PubMed

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