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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Kofi Edee1, Gérard Granet, Jean-Píerre Plumey
1Laboratoire des Sciences et Matériaux pour l'Electronique et d'Automatique, CNRS/UMR 6602, Université Blaise Pascal, Les Cézeaux, 63177 Aubière Cedex, France.
This study introduces an efficient electromagnetic modeling technique for plane-wave diffraction on nonperiodic surfaces using the curvilinear coordinate method (CCM). The enhanced CCM effectively handles complex geometries and electromagnetic fields for accurate surface modeling.
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