Yu-hong Xiong1, Zhi-yu Wen, Yu-qian Liang
1College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China. xyh341@sohu.com
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This study introduces a new model transfer method using support vector machines and piecewise direct standardization to address nonlinear effects and small sample sizes in spectrometer data. This approach improves data comparability across different instruments.
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