Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Search research articles

Related Experiment Video

Updated: Jul 15, 2026

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform

Published on: October 6, 2019

Development of a microlateral force sensor and its evaluation using lateral force microscopy.

Yasuhisa Ando¹, Naoki Shiraishi

¹National Institute of Advanced Industrial Science and Technology (AIST), 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan.

The Review of Scientific Instruments

|April 7, 2007

Summary

A novel microlateral force sensor (MLFS) was developed for atomic force microscopy (AFM). This sensor accurately maps lateral forces, correlating well with traditional methods and AFM topography gradients.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Intratumoral heterogeneity of intermediate CLDN18.2 expression in gastric cancer.

International journal of clinical oncology·2026

Same author

Initial Experience With Endoscopic Ultrasound-Guided Gallbladder Drainage Using Lumen-apposing Metal Stents in Extremely Elderly and Frail Patients.

DEN open·2026

Same author

Paired tumor-normal metabolomic profiling reveals alterations in choline phospholipid precursor metabolism in biliary tract cancer.

Journal of gastroenterology·2026

Same author

Robotic distal pancreatectomy has a lower incidence than open surgery of clinically relevant pancreatic fistula: a propensity score-matched analysis with emphasis on inflammation and microbial contamination.

Surgery today·2026

Same author

Outcomes of Spiral Versus Conventional Double Pigtail Plastic Stents in Permanent Transpapillary Gallbladder Drainage for Acute Cholecystitis.

Digestive diseases and sciences·2026

Same author

Pancreaticobiliary Fistula Caused by Intraductal Papillary Mucinous Adenoma Requiring Pancreaticoduodenectomy.

Surgical case reports·2026

Area of Science:

Nanotechnology
Surface Science
Microscopy

Background:

Atomic Force Microscopy (AFM) is a powerful tool for surface analysis.
Measuring lateral forces with high sensitivity remains a challenge in AFM.
Existing methods for lateral force measurement can be complex or limited in scope.

Purpose of the Study:

To develop and evaluate a novel microlateral force sensor (MLFS).
To enable accurate mapping of lateral forces using AFM.
To compare the performance of the MLFS with conventional lateral force microscopy (LFM).

Main Methods:

Development of an MLFS integrated with a comb actuator and tunneling current detection.
Utilizing AFM to apply lateral forces and scan a sensing table.

More Related Videos

Protrusion Force Microscopy: A Method to Quantify Forces Developed by Cell Protrusions

Protrusion Force Microscopy: A Method to Quantify Forces Developed by Cell Protrusions

Published on: June 16, 2018

Microfabricated Post-Array-Detectors (mPADs): an Approach to Isolate Mechanical Forces

Microfabricated Post-Array-Detectors (mPADs): an Approach to Isolate Mechanical Forces

Published on: October 1, 2007

Related Experiment Videos

Last Updated: Jul 15, 2026

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform

Published on: October 6, 2019

Protrusion Force Microscopy: A Method to Quantify Forces Developed by Cell Protrusions

Protrusion Force Microscopy: A Method to Quantify Forces Developed by Cell Protrusions

Published on: June 16, 2018

Microfabricated Post-Array-Detectors (mPADs): an Approach to Isolate Mechanical Forces

Microfabricated Post-Array-Detectors (mPADs): an Approach to Isolate Mechanical Forces

Published on: October 1, 2007

Acquiring lateral force images by monitoring changes in the comb actuator's driving voltage.

Main Results:

The MLFS successfully generated lateral force microscopy (LFM) images.
MLFS-generated LFM images showed high similarity to conventional LFM images.
The MLFS LFM images strongly correlated with the gradient of AFM topographic images.

Conclusions:

The developed MLFS is a viable tool for lateral force measurements in AFM.
The MLFS offers comparable performance to traditional LFM techniques.
The sensor's sensitivity is validated by its correlation with AFM topography gradients.