Yu-Liang Wang1, Xue-Zeng Zhao, Fa-Quan Zhou
1School of Mechatronic Engineering, Harbin Institute of Technology, Harbin 150001, People's Republic of China. wangyuliang2005@gmail.com
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An improved atomic force microscope (AFM) method accurately measures nano/microfriction forces. This technique simplifies calculations by focusing on cantilever geometry, eliminating the need for thickness or material property data.
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