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Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging

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Published on: November 25, 2009

Scanning near-field optical microscopy signal processing and resolution.

Thomas Grosges¹, Dominique Barchiesi

¹Laboratoire de Nanotechonologie et d'Instrumentation Optique, Institut Charles Delaunay, Université de Technologie de Troyes, Troyes Cedex, France. thomas.grosgges@utt.fr

|April 7, 2007

Summary

A lock-in amplifier improves scanning probe microscopy by enhancing signal quality. This method suppresses background noise, enabling clearer imaging of nanoparticles and improving resolution.

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Area of Science:

Scanning Probe Microscopy
Near-field Optics

Background:

Lock-in amplifiers are crucial for enhancing signal-to-noise ratio in scanning probe microscopy.
Spatially slow varying signals can obscure detailed measurements.

Purpose of the Study:

To improve signal quality in scanning probe microscopy.
To suppress background information and enhance resolution.

Main Methods:

Utilizing a lock-in amplifier to process signals.
Reconstructing signals from lock-in data, considering evanescent and homogeneous waves.
Developing a method to suppress background noise.

Main Results:

The reconstructed signal includes contributions from both evanescent and homogeneous waves in the near-field.
A method was established to effectively suppress unwanted background information.
Experimental images of nanoparticles were processed, demonstrating the method's utility.

Conclusions:

The lock-in amplifier technique effectively enhances signal quality in scanning probe microscopy.
The developed method successfully suppresses background noise, leading to improved resolution.
This approach is valuable for analyzing nanoscale structures like nanoparticles.