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Updated: Jul 15, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
Andrei Y Nikulin1, Ruben A Dilanian, Nadia A Zatsepin
1School of Physics, Monash University, Clayton, Victoria 3800, Australia. Andrei.Nikulin@sci.monash.edu.au
A new X-ray diffraction analysis method non-destructively determines nanoscale particle and cluster shapes in 3D. This technique enables in situ analysis of large material volumes with high spatial resolution, suitable for lab settings.
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