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Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction

Wook Jo1, Chan Park, Doh-Yeon Kim

  • 1Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea. whdnr01@snu.ac.kr

Acta Crystallographica. Section A, Foundations of Crystallography
|April 17, 2007
PubMed

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