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Updated: Jul 15, 2026
High Pressure Single Crystal Diffraction at PX^2
Published on: January 16, 2017
Kinematical multiple diffraction: the width of psi-scan intensity profiles
1Mineralogisch-Petrographisches Institut der Universität Hamburg, D-20146 Hamburg, Grindelallee 48, Germany. rossmanith@mineralogie.uni-hamburg.de
Abstract:
It was shown in Rossmanith [Acta Cryst. (1992), A48, 596-610] that the peak width of intensity profiles of multiple diffraction events can be calculated in a simple manner from the divergence delta and the wavelength spread Deltalambda/lambda of the incident beam and from the mosaic spread eta and the magnitude r of the ideally perfect crystallites in the sample. In the present paper, an improvement of the concept is given.
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