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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Cryo-electron Microscopy01:28

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...

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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

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Published on: July 17, 2015

Imaging using inelastically scattered electrons in CTEM and STEM geometry.

S D Findlay1, P Schattschneider, L J Allen

  • 1School of Physics, University of Melbourne, Victoria 3010, Australia.

Ultramicroscopy
|May 2, 2007
PubMed
Summary

Energy filtered transmission electron microscopy (EFTEM) images closely resemble energy spectroscopic scanning transmission electron microscopy (ESS-TEM) images. This similarity holds for single atoms and crystals, with minimal impact from energy differences in scattered electrons.

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Area of Science:

  • Materials Science
  • Physics
  • Microscopy

Background:

  • Transmission electron microscopy (TEM) is a powerful tool for materials characterization.
  • Energy filtering and spectroscopic techniques in TEM provide detailed chemical and electronic information.
  • Understanding the relationship between different TEM imaging modes is crucial for accurate interpretation.

Purpose of the Study:

  • To investigate the relationship between energy filtered transmission electron microscopy (EFTEM) and energy spectroscopic scanning transmission electron microscopy (ESS-TEM) images.
  • To explore this relationship for single atoms and crystalline materials.

Main Methods:

  • Utilized coupled channels and density matrix approaches for theoretical analysis.
  • Applied these methods to model single-atom scattering scenarios.
  • Extended the analysis to crystalline structures.

Main Results:

  • Demonstrated a close relationship between EFTEM and ESS-TEM images.
  • Confirmed the persistence of this similarity in crystalline materials.
  • Quantified the limiting effects of energy differences in scattered electrons, finding them to be small for typical high-resolution TEM specimens.

Conclusions:

  • EFTEM and ESS-TEM provide comparable imaging information.
  • The observed similarity is robust across different sample types (single atom to crystal).
  • Practical implications for high-resolution TEM imaging are minimal regarding energy spread effects.