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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Quantitative Hardness Measurement by Instrumented AFM-indentation

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Published on: November 22, 2016

Calibration of atomic force microscope cantilevers using piezolevers.

Saltuk B Aksu¹, Joseph A Turner

¹Department of Engineering Mechanics, W317.4 Nebraska Hall, University of Nebraska-Lincoln, Lincoln, NE 68588-0526, USA.

The Review of Scientific Instruments

|May 5, 2007

Summary

A new piezolever method offers a fast, easy, and nondestructive way to calibrate atomic force microscope (AFM) cantilevers. This technique provides quantitative data comparable to nanoindentation, enhancing AFM

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale imaging and analysis.
Quantitative AFM measurements require precisely calibrated cantilevers.
Existing calibration methods can be time-consuming or destructive.

Purpose of the Study:

To introduce and validate a novel piezolever-based technique for AFM cantilever calibration.
To assess the accuracy and reliability of the piezolever calibration method.
To demonstrate the applicability of the method across a range of cantilever stiffness values.

Main Methods:

A reference piezolever was utilized to calibrate 13 different commercially available AFM cantilevers.
Stiff cantilevers (>0.4 N/m) were calibrated using the piezolever method.
Results were compared against stiffness values obtained through nanoindentation measurements.

Main Results:

The piezolever calibration method demonstrated good agreement with nanoindentation data for stiff cantilevers.
The technique is effective for cantilevers with stiffness ranging from 0.08 to 6.02 N/m.
Calibration using the piezolever is fast, easy, and nondestructive.

Conclusions:

The piezolever method provides a reliable and efficient approach for quantitative AFM cantilever calibration.
This technique enhances the utility of standard Atomic Force Microscopes for precise measurements.
No specialized AFM laser calibration is required, simplifying the experimental setup.